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EXPLORER XRD INSTRUMENT
Endless Flexibility and Modularity
Explorer is a versatile Theta/Theta high-resolution diffractometer that provides exceptional performance across various analytical fields, ranging from phase analysis to the assessment of microstructural characteristics in both bulk and thin film materials, all thanks to its direct drive torque motors.
Due to its modular design and the extensive variety of accessories and attachments available, the Explorer can conduct measurements in various configurations:
The modularity and adaptability of the Explorer system enable users to begin with a basic setup that can be upgraded to accommodate evolving requirements. GNR can provide a diverse selection of X-ray sources, optics, sample holders, detectors, and configurations to fulfill numerous analytical demands.
With limitless application possibilities, the Explorer modular system delivers high performance across all analytical fields, from quantifying phases in mixtures to assessing microstructural characteristics such as residual stress and the preferred orientation of crystallites in both bulk materials and thin films.
The optical system allows for transitions between Bragg-Brentano, focusing, and parallel beam geometries utilizing Johansson or parabolic mirror monochromators.
High-resolution reflectometry studies can be conducted with EXPLORER to evaluate layer thickness (ranging from 1 to 500 nm with an accuracy exceeding 1%), density (with an accuracy of better than ± 0.03 g/cm³), and surface and interface roughness (from 0 to 5 nm with an accuracy of better than ± 0.1 nm).
Low-angle measurements and a thin film attachment for parallel beam geometry enable the examination of thin films and multilayer structures.
The combination of a parabolic mirror monochromator and a channel-cut crystal positioned on the incoming beam produces a monochromatic parallel beam characterized by high intensity and low divergence, ideal for high-resolution measurements.
Data Collection Programs
GNR provides a wide range of acquisition programs, catering to both standard and tailored hardware setups. This encompasses programs for powder and high-resolution diffractometers, retained austenite analysis, stress data acquisition (including plane and triaxial), and thin films (XRD and GIXRD).
SAX
Single peak evaluations; peak processing. Background removal, smoothing, deconvolution, and peak localization. Structural evaluation, crystallite size determination, lattice strain analysis, reflectometry, and quantitative assessment.
Search and Match: MATCH!
Rietveld refinement, display and comparison of multiple diffraction partners, direct viewing of specific phases/entries, instant access to additional information, saving of selection parameters, user-friendly background definition, enhanced zoom capabilities, batch processing, and automation.
You can contact us at any time for detailed information about our devices and pricing options.
As ANKA ANALİTİK, we continue to support real sector companies that we contribute to improve production technologies and increase material quality and efficiency with our chemical analysis, quality control, and laboratory devices for more than 20 years.
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