AreX D is the inaugural benchtop diffractometer specifically created for the quick, precise, and straightforward assessment of Retained Austenite, adhering to the ASTM E 975-03 standard practice for x-ray analysis of Retained Austenite in steel exhibiting nearly random crystallographic orientation.

Phase transformation in critical and structural steel components is a crucial and sensitive factor that needs assessment, as the mechanical and physical characteristics of steels are influenced by their phase composition.

In various industrial applications, it is essential to determine Retained Austenite at very low concentrations with high accuracy. Traditional metallographic methods, including chemical etching and optical assessment of Retained Austenite, often fall short in terms of precision and sensitivity.

Accurately measuring retained austenite content is vital for establishing and controlling numerous heat treatment processes, and it also plays a significant role in Additive Manufacturing techniques.

The AreX Desktop is a fixed angular range X-Ray Diffractometer that incorporates the latest technical advancements, ensuring precision, accuracy, safety, and user-friendliness, specifically designed for the quantitative assessment of Retained Austenite in a compact desktop format.

X-Ray Diffraction (XRD) is regarded as the most precise method for measuring retained austenite levels, capable of detecting concentrations as low as 0.5%. The AreX diffractometer measures the integrated intensities of the austenite (220) and (311) peaks as well as the ferrite (200) and (211) peaks. Utilizing multiple diffraction peaks helps reduce the impact of preferred orientation and enables the identification of carbide interference.

AreX is the only instrument that ensures compliance with ASTM E 975 – 03 standards.

With AreX's innovative design, the volume percentage of Retained Austenite can be quantified within minutes by simply placing the sample and pressing the start button. The typical measurement duration is 180 seconds.